Reciprocal-space mapping - Revision history

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2015-09-02T13:12:37Z

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2015-02-23T17:48:16Z

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KevinYager at 21:34, 12 January 2015

2015-01-12T21:34:16Z

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Reciprocal-space mapping (RSM) refers to a suite of [[scattering]] methods wherein the three-dimensional [[reciprocal-space]] of the sample is reconstructed by iteratively measuring a variety of two-dimensional 'slices' through the space. A given [[x-ray]] scattering experiment probes a 2D plane through reciprocal-space (actually a curved surface, known as the [[Ewald sphere]]). By [[sample orientation|reorienting]] the sample, multiple 'slices' through reciprocal-space can be obtained. These slices can then be combined to yield the full, 3D reciprocal-space.

==See Also==
* [[CD-SAXS]] and [[RSANS]]
* [http://scitation.aip.org/content/aip/journal/apl/80/21/10.1063/1.1481786 Strain and composition distributions in wurtzite InGaN/GaN layers extracted from x-ray reciprocal space mapping] S. Pereira, M. R. Correia, E. Pereira, K. P. O’Donnell, E. Alves, A. D. Sequeira, N. Franco, I. M. Watson and C. J. Deatcher ''Appl. Phys. Lett.'' '''2002''', 80, 3913. [http://dx.doi.org/10.1063/1.1481786 doi: 10.1063/1.1481786]
* [http://scripts.iucr.org/cgi-bin/paper?S0909049505030815 Reciprocal space mapping and single-crystal scattering rods] D.-M. Smilgies, D. R. Blasini, S. Hotta and H. Yanagi ''J. Synchrotron Rad.'' '''2005''', 12, 807-811. [http://dx.doi.org/10.1107/S0909049505030815 doi: 10.1107/S0909049505030815]
* [http://scitation.aip.org/content/aip/journal/apl/90/18/10.1063/1.2736193 X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene] Hiroyuki Yoshida, Katsuhiko Inaba and Naoki Sato ''Appl. Phys. Lett.'' '''2007''', 90, 181930. [http://dx.doi.org/10.1063/1.2736193 doi: 10.1063/1.2736193]

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 * [http://scripts.iucr.org/cgi-bin/paper?S0909049505030815 Reciprocal space mapping and single-crystal scattering rods] D.-M. Smilgies, D. R. Blasini, S. Hotta and H. Yanagi ''J. Synchrotron Rad.'' '''2005''', 12, 807-811. [http://dx.doi.org/10.1107/S0909049505030815 doi: 10.1107/S0909049505030815]
 * [http://scitation.aip.org/content/aip/journal/apl/90/18/10.1063/1.2736193 X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene] Hiroyuki Yoshida, Katsuhiko Inaba and Naoki Sato ''Appl. Phys. Lett.'' '''2007''', 90, 181930. [http://dx.doi.org/10.1063/1.2736193 doi: 10.1063/1.2736193]
 * [http://scripts.iucr.org/cgi-bin/paper?te5002 Nebula: reconstruction and visualization of scattering data in reciprocal space] A. Reiten, D. Chernyshov and R. H. Mathiesen ''J. Appl. Cryst.'' '''2015''', 48. [http://dx.doi.org/10.1107/S1600576715001788 doi: 10.1107/S1600576715001788]
 * [http://scripts.iucr.org/cgi-bin/paper?rg5089 BINoculars: data reduction and analysis software for two-dimensional detectors in surface X-ray diffraction] S. Roobol, W. Onderwaater, J. Drnec, R. Felici and J. Frenken ''J. Appl. Cryst.'' '''2015''', 48. [http://dx.doi.org/10.1107/S1600576715009607 doi: 10.1107/S1600576715009607]

← Older revision		Revision as of 17:12, 8 July 2015
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	* [http://scitation.aip.org/content/aip/journal/apl/90/18/10.1063/1.2736193 X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene] Hiroyuki Yoshida, Katsuhiko Inaba and Naoki Sato ''Appl. Phys. Lett.'' '''2007''', 90, 181930. [http://dx.doi.org/10.1063/1.2736193 doi: 10.1063/1.2736193]		* [http://scitation.aip.org/content/aip/journal/apl/90/18/10.1063/1.2736193 X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene] Hiroyuki Yoshida, Katsuhiko Inaba and Naoki Sato ''Appl. Phys. Lett.'' '''2007''', 90, 181930. [http://dx.doi.org/10.1063/1.2736193 doi: 10.1063/1.2736193]
	* [http://scripts.iucr.org/cgi-bin/paper?te5002 Nebula: reconstruction and visualization of scattering data in reciprocal space] A. Reiten, D. Chernyshov and R. H. Mathiesen ''J. Appl. Cryst.'' '''2015''', 48. [http://dx.doi.org/10.1107/S1600576715001788 doi: 10.1107/S1600576715001788]		* [http://scripts.iucr.org/cgi-bin/paper?te5002 Nebula: reconstruction and visualization of scattering data in reciprocal space] A. Reiten, D. Chernyshov and R. H. Mathiesen ''J. Appl. Cryst.'' '''2015''', 48. [http://dx.doi.org/10.1107/S1600576715001788 doi: 10.1107/S1600576715001788]
		+	* [http://scripts.iucr.org/cgi-bin/paper?rg5089 BINoculars: data reduction and analysis software for two-dimensional detectors in surface X-ray diffraction] S. Roobol, W. Onderwaater, J. Drnec, R. Felici and J. Frenken ''J. Appl. Cryst.'' '''2015''', 48. [http://dx.doi.org/10.1107/S1600576715009607 doi: 10.1107/S1600576715009607]

← Older revision		Revision as of 17:48, 23 February 2015
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	* [http://scripts.iucr.org/cgi-bin/paper?S0909049505030815 Reciprocal space mapping and single-crystal scattering rods] D.-M. Smilgies, D. R. Blasini, S. Hotta and H. Yanagi ''J. Synchrotron Rad.'' '''2005''', 12, 807-811. [http://dx.doi.org/10.1107/S0909049505030815 doi: 10.1107/S0909049505030815]		* [http://scripts.iucr.org/cgi-bin/paper?S0909049505030815 Reciprocal space mapping and single-crystal scattering rods] D.-M. Smilgies, D. R. Blasini, S. Hotta and H. Yanagi ''J. Synchrotron Rad.'' '''2005''', 12, 807-811. [http://dx.doi.org/10.1107/S0909049505030815 doi: 10.1107/S0909049505030815]
	* [http://scitation.aip.org/content/aip/journal/apl/90/18/10.1063/1.2736193 X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene] Hiroyuki Yoshida, Katsuhiko Inaba and Naoki Sato ''Appl. Phys. Lett.'' '''2007''', 90, 181930. [http://dx.doi.org/10.1063/1.2736193 doi: 10.1063/1.2736193]		* [http://scitation.aip.org/content/aip/journal/apl/90/18/10.1063/1.2736193 X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene] Hiroyuki Yoshida, Katsuhiko Inaba and Naoki Sato ''Appl. Phys. Lett.'' '''2007''', 90, 181930. [http://dx.doi.org/10.1063/1.2736193 doi: 10.1063/1.2736193]
		+	* [http://scripts.iucr.org/cgi-bin/paper?te5002 Nebula: reconstruction and visualization of scattering data in reciprocal space] A. Reiten, D. Chernyshov and R. H. Mathiesen ''J. Appl. Cryst.'' '''2015''', 48. [http://dx.doi.org/10.1107/S1600576715001788 doi: 10.1107/S1600576715001788]

← Older revision		Revision as of 21:34, 12 January 2015
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−	Reciprocal-space mapping (RSM) refers to a suite of [[scattering]] methods wherein the three-dimensional [[reciprocal-space]] of the sample is reconstructed by iteratively measuring a variety of two-dimensional 'slices' through the space. A given [[x-ray]] scattering experiment probes a 2D plane through reciprocal-space (actually a curved surface, known as the [[Ewald sphere]]). By [[sample orientation\|reorienting]] the sample, multiple 'slices' through reciprocal-space can be obtained. These slices can then be combined to yield the full, 3D reciprocal-space.	+	'''Reciprocal-space mapping''' ('''RSM''') refers to a suite of [[scattering]] methods wherein the three-dimensional [[reciprocal-space]] of the sample is reconstructed by iteratively measuring a variety of two-dimensional 'slices' through the space. A given [[x-ray]] scattering experiment probes a 2D plane through reciprocal-space (actually a curved surface, known as the [[Ewald sphere]]). By [[sample orientation\|reorienting]] the sample, multiple 'slices' through reciprocal-space can be obtained. These slices can then be combined to yield the full, 3D reciprocal-space.

	==See Also==		==See Also==

@@ Line 3: / Line 3: @@
 ==See Also==
 * [[CD-SAXS]] and [[RSANS]]
 * [http://scitation.aip.org/content/aip/journal/apl/80/21/10.1063/1.1481786 Strain and composition distributions in wurtzite InGaN/GaN layers extracted from x-ray reciprocal space mapping]  S. Pereira, M. R. Correia, E. Pereira, K. P. O’Donnell, E. Alves, A. D. Sequeira, N. Franco, I. M. Watson and C. J. Deatcher ''Appl. Phys. Lett.'' '''2002''', 80, 3913. [http://dx.doi.org/10.1063/1.1481786 doi: 10.1063/1.1481786]
 * [http://scripts.iucr.org/cgi-bin/paper?S0909049505030815 Reciprocal space mapping and single-crystal scattering rods] D.-M. Smilgies, D. R. Blasini, S. Hotta and H. Yanagi ''J. Synchrotron Rad.'' '''2005''', 12, 807-811. [http://dx.doi.org/10.1107/S0909049505030815 doi: 10.1107/S0909049505030815]
 * [http://scitation.aip.org/content/aip/journal/apl/90/18/10.1063/1.2736193 X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene] Hiroyuki Yoshida, Katsuhiko Inaba and Naoki Sato ''Appl. Phys. Lett.'' '''2007''', 90, 181930. [http://dx.doi.org/10.1063/1.2736193 doi: 10.1063/1.2736193]