Kikuchi patterns - Revision history

KevinYager: Redirected page to Multiple scattering

2019-06-03T15:56:23Z

Redirected page to Multiple scattering

KevinYager at 14:37, 27 October 2015

2015-10-27T14:37:04Z

KevinYager at 22:14, 13 October 2015

2015-10-13T22:14:32Z

KevinYager at 22:12, 13 October 2015

2015-10-13T22:12:06Z

KevinYager: Created page with "TBD ==See Also== * G. Nolze, C. Grosse and A. Winkelmann [http://scripts.iucr.org/cgi-bin/paper?vh5033 Kikuchi pattern analysis of noncentrosymmetric crystals] ''J. Appl. Cry..."

2015-08-18T16:12:21Z

Created page with "TBD ==See Also== * G. Nolze, C. Grosse and A. Winkelmann [http://scripts.iucr.org/cgi-bin/paper?vh5033 Kikuchi pattern analysis of noncentrosymmetric crystals] ''J. Appl. Cry..."

New page

TBD

==See Also==
* G. Nolze, C. Grosse and A. Winkelmann [http://scripts.iucr.org/cgi-bin/paper?vh5033 Kikuchi pattern analysis of noncentrosymmetric crystals] ''J. Appl. Cryst.'' '''2015''', 48. [http://dx.doi.org/10.1107/S1600576715014016 doi: 10.1107/S1600576715014016]

← Older revision		Revision as of 15:56, 3 June 2019
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−	~~Sharp intersecting lines are sometimes observed in~~ [[diffraction]] data for single-crystal or poly-crystalline materials, depending on the experimental geometry. In electron microscopy, multiple-scattering events create these '''Kikuchi patterns''', while in x-ray scattering they may be called '''Kossel lines'''. These lines arise due to multiple-scattering effect, e.g. when the x-ray source has high divergence.	+	#REDIRECT [[Multiple scattering]]
−
−	~~Using a high-flux [[x-ray]] source ([[synchrotron]]), one can observe a related effect purely from the [[diffuse scattering]] undergoing multiple scattering. '~~Multiple ~~diffuse~~ scattering~~' (DMS) can thus give rise to weak lines in a [[scattering]] image for crystalline materials (e.g. if one's sample is supported on a [[Material:Silicon\|silicon~~]~~] substrate).~~
−
−	~~==See Also==~~
−	* W. G. Morris [http://scitation.aip.org/content/aip/journal/jap/39/3/10.1063/1.1656436 Crystal orientation and lattice parameters from Kossel lines] ''J. Appl. Phys.'' '''1968''', 39, 1813–1823. [http://dx.doi.org/10.1063/1.1656436 doi: 10.1063/1.1656436]
−	* G. Nolze, C. Grosse and A. Winkelmann [http://scripts.iucr.org/cgi-bin/paper?vh5033 Kikuchi pattern analysis of noncentrosymmetric crystals] ''J. Appl. Cryst.'' '''2015''', 48. [http://dx.doi.org/10.1107/S1600576715014016 doi: 10.1107/S1600576715014016]
−	* A.G.A. Nisbet, G. Beutier, F. Fabrizi, B. Mosera and S. P. Collins [http://journals.iucr.org/a/issues/2015/01/00/td5022/index.html Diffuse multiple scattering] ''Acta Cryst. A'' '''2015''', 20-25. [http://dx.doi.org/10.1107/S2053273314026515 doi: 10.1107/S2053273314026515]

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-Sharp intersecting lines are sometimes observed in [[scattering]] data for single-crystal materials (e.g. if one's sample is supported on a [[Material:Silicon|silicon]] substrate). In electron microscopy, multiple-scattering events create these '''Kikuchi patterns''', while in x-ray scattering they may be called '''Kossel lines'''.
+Sharp intersecting lines are sometimes observed in [[diffraction]] data for single-crystal or poly-crystalline materials, depending on the experimental geometry. In electron microscopy, multiple-scattering events create these '''Kikuchi patterns''', while in x-ray scattering they may be called '''Kossel lines'''. These lines arise due to multiple-scattering effect, e.g. when the x-ray source has high divergence.
 ==See Also==
 * W. G. Morris [http://scitation.aip.org/content/aip/journal/jap/39/3/10.1063/1.1656436 Crystal orientation and lattice parameters from Kossel lines] ''J. Appl. Phys.'' '''1968''', 39, 1813–1823. [http://dx.doi.org/10.1063/1.1656436 doi: 10.1063/1.1656436]
 * G. Nolze, C. Grosse and A. Winkelmann [http://scripts.iucr.org/cgi-bin/paper?vh5033 Kikuchi pattern analysis of noncentrosymmetric crystals] ''J. Appl. Cryst.'' '''2015''', 48. [http://dx.doi.org/10.1107/S1600576715014016 doi: 10.1107/S1600576715014016]

← Older revision		Revision as of 22:14, 13 October 2015
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−	Sharp intersecting lines are sometimes observed in [[scattering]] data for single-crystal materials (e.g. if one's sample is supported on a [[Material:Silicon\|silicon]] substrate). In electron microscopy, these ~~are called~~ '''Kikuchi patterns''', while in x-ray scattering ~~there~~ may be called '''Kossel lines'''.	+	Sharp intersecting lines are sometimes observed in [[scattering]] data for single-crystal materials (e.g. if one's sample is supported on a [[Material:Silicon\|silicon]] substrate). In electron microscopy, multiple-scattering events create these '''Kikuchi patterns''', while in x-ray scattering they may be called '''Kossel lines'''.
−
−	~~These arise from the intersection of the detector plane ([[Ewald sphere]]) with the [[reciprocal-space]] scattering~~.