CMS - Revision history

KevinYager: /* Beamline Staff */

2018-12-12T13:23:27Z

‎Beamline Staff

2018-11-17T22:48:19Z

‎Beamline Staff

2018-08-09T13:25:50Z

‎Normal Beam

2018-07-26T14:41:46Z

‎Training

2018-06-17T12:17:06Z

2017-06-25T19:50:08Z

‎Beamline Staff

2017-06-25T19:49:31Z

‎Access

2017-06-25T19:23:00Z

‎Resolution

2017-04-05T16:26:03Z

‎Configuration

2017-03-21T13:40:18Z

‎Performance

@@ Line 219: / Line 219: @@
 * email: [mailto:etsai@bnl.gov etsai@bnl.gov]
 * office phone: 631-344-'''6149'''
-* office location: Bldg. 735 (CFN), (2nd floor, east side)
+* office location: Bldg. 735 (CFN), 2029 (2nd floor, east side)
 | [[Image:Esther-Tsai-270px.jpg|150px|link=https://www.bnl.gov/cfn/people/staff.php?q=232]]
 |-

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 * office location: Bldg. 735 (CFN), room 2018 (2nd floor, east side)
 | [[Image:Kevin_Yager01.jpg|150px|link=https://www.bnl.gov/cfn/people/staff.php?q=150]]
 |-
 |-

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 | '''1.9&times;10<sup>9</sup>'''
 | [https://logbook.nsls2.bnl.gov/11-BM/index.html#834_2 834_2]
 |-
 |}

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 |-
 |}
 ==Training==

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 [[Image:logo_CMS_20.png|thumb|200px|right]]
-The '''Complex Materials Scattering''' ('''CMS''') [[beamline]] at [[NSLS-II]] is a [[synchrotron]] instrument focused on [[x-ray]] [[scattering]]. It is located at 11-BM ([[bending magnet]] port) on the NSLS-II floor, and features a [[three-pole wiggler]] source. It can perform [[SAXS]] and [[WAXS]] experiments, focusing on high-throughput and 'intelligent' machine-guided exploration of parameter spaces.
+The '''Complex Materials Scattering''' ('''CMS''') [[beamline]] at [[NSLS-II]] is a [[synchrotron]] instrument focused on [[x-ray]] [[scattering]]. It is located at 11-BM ([[bending magnet]] port) on the NSLS-II floor, and features a [[three-pole wiggler]] source. It can perform [[SAXS]] and [[WAXS]] experiments, focusing on ambitious synchrotron experiments, including [[in-situ]] or [[operando]] studies of materials during synthesis, processing, or operation; and autonomous experiments including high-throughput explorations and 'intelligent' machine-guided exploration of parameter spaces.
 [[Image:CMS_beamline01.jpg|thumb|500px|center]]
 ==Capabilities==
-CHX can perform a variety of experiments:
+CMS can perform a variety of experiments:
 * [[SAXS]]
 * [[GISAXS]]

@@ Line 188: / Line 188: @@
 | Ruipeng Li (beamline staff)
 * email: [mailto:rli@bnl.gov rli@bnl.gov]
-* office phone: 631-344-'''????'''
+* office phone: 631-344-'''5994'''
 * office location: Bldg. 744 (green LOB of NSLS-II), room 4L140
 | [[Image:Ruipeng_Li01.jpg|150px|link=https://www.bnl.gov/]]

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 ==Access==
-CMS has taken 'first light' and is currently completing technical commissioning. General User access is scheduled for summer 2017. Access will be possible through the [http://www0.bnl.gov/ps/PASS/ NSLS-II proposal system], and through the [[CFN]] [https://www.bnl.gov/cfn/user/ proposal system]. Interested users should contact beamline staff.
+CMS is available for general user experiments. Proposals can be submitted through the [http://www0.bnl.gov/ps/PASS/ NSLS-II proposal system], and through the [[CFN]] [https://www.bnl.gov/cfn/user/ proposal system]. Interested users should contact beamline staff.
 ==Contact==

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 {| class="wikitable"
 |-
-! beam size (mm)
+! beam size
-! beam divergence (mrad)
+! beam divergence
-! pixel size (mm)
+! pixel size
-! pixel FW @ 5 m (mrad)
+! pixel FW @ 5 m
-! pixel FW @ 5 m, 13.5 keV (Å<sup>−1</sup>)
+! pixel FW @ 5 m, 13.5 keV
-! resolution, FWHM (Å<sup>−1</sup>)
+! resolution
 |-
 |-
@@ Line 41: / Line 50: @@
 | 0.00024
 | 0.0007
 |-
 | 0.100
@@ Line 48: / Line 58: @@
 | 0.00024
 | 0.0002
 |-
 |}

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 ==Configuration==
-CMS is a fairly flexible SAXS/WAXS instrument. The instrument has two detectors (SAXS and WAXS) that can be repositioned as needed for experiments. The sample environment is flexible, with the ability to measure samples in vacuum or in air.
+CMS is a flexible SAXS/WAXS instrument. The instrument has two detectors (SAXS and WAXS) that can be repositioned as needed for experiments. The sample environment is flexible, with the ability to measure samples in vacuum or in air.
 * [[CMS:Sample area]]
 ==Access==

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 * Typical 50-100 µm
 * Beam can be shaped (using slits) to 10 µm.
 ==Access==